TEST_NAME : Wafer
TEST_DATE : 24_09_05-11_05_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-007-003-00 | FUSED_ID : 6359364768394932272
  IC_TEMP :  -57.85 | VDDM : 1118.43 | AUX_INT :   -8.96 | CsaBias :   70.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21812e-03 / 2
  ADC_P0  : -8.95955e-03 ± 2.36072e-02
  ADC_P1  : 8.94315e-03 ± 6.08320e-04
  ADC_P2  : -7.06900e-06 ± 3.11446e-06
  CSA_Chi2/NDF : 1.65392e-04 / 2
  CSA_P0  : 5.83085e-02 ± 8.57787e-03
  CSA_P1  : 1.02728e-02 ± 6.46280e-04
  CSA_P2  : -5.12133e-05 ± 9.84208e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [33, 39, 65, 70, 76, 84, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [9, 19, 28, 34, 42, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3855', '1.800', '0.1178', '1.800', '0.0934', '7.000', '0.7075', 1, 1, 1, 1, 1725527140.6329963]
VI_after__Init : ['1.202', '0.3858', '1.800', '0.1179', '1.800', '0.0884', '7.000', '0.7076', 1, 1, 1, 1, 1725527148.7794592]
VI_at__the_End : ['1.202', '0.4977', '1.800', '0.1433', '1.802', '0.1139', '7.000', '0.7080', 1, 1, 1, 1, 1725527215.090208]