TEST_NAME : Wafer
TEST_DATE : 24_09_05-10_51_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-007-012-00 | FUSED_ID : 6359364768394932416
  IC_TEMP :  -51.89 | VDDM : 1125.67 | AUX_INT :   -6.91 | CsaBias :   84.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15986e-03 / 2
  ADC_P0  : -6.91246e-03 ± 2.31008e-02
  ADC_P1  : 8.33290e-03 ± 5.73188e-04
  ADC_P2  : -5.21559e-06 ± 2.82416e-06
  CSA_Chi2/NDF : 1.15398e-04 / 2
  CSA_P0  : 6.09411e-02 ± 7.16509e-03
  CSA_P1  : 9.97590e-03 ± 5.39838e-04
  CSA_P2  : -4.69713e-05 ± 8.22109e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [3, 39, 66, 69, 74, 86, 87]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [29, 41, 48, 57, 58, 72, 84, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3222', '1.800', '0.1244', '1.800', '0.0895', '7.000', '0.7076', 1, 1, 1, 1, 1725526271.713261]
VI_after__Init : ['1.202', '0.3222', '1.800', '0.1245', '1.800', '0.0840', '7.000', '0.7076', 1, 1, 1, 1, 1725526279.900718]
VI_at__the_End : ['1.198', '0.4968', '1.800', '0.1404', '1.806', '0.1127', '7.000', '0.7083', 1, 1, 1, 1, 1725526348.3915067]