TEST_NAME : Wafer
TEST_DATE : 24_09_05-10_48_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-007-014-00 | FUSED_ID : 6359364768394932448
  IC_TEMP :  -51.62 | VDDM : 1136.20 | AUX_INT :   -8.79 | CsaBias :   66.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38119e-03 / 2
  ADC_P0  : -8.79466e-03 ± 2.52355e-02
  ADC_P1  : 8.41236e-03 ± 6.30420e-04
  ADC_P2  : -5.19370e-06 ± 3.13875e-06
  CSA_Chi2/NDF : 1.48510e-04 / 2
  CSA_P0  : 6.05538e-02 ± 8.12831e-03
  CSA_P1  : 1.03859e-02 ± 6.12410e-04
  CSA_P2  : -5.27235e-05 ± 9.32627e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [17, 35, 57, 87, 88, 110, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [3, 43, 69, 98, 105, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1387', '1.800', '0.1615', '1.800', '0.0831', '7.000', '0.7081', 1, 1, 1, 1, 1725526079.6800015]
VI_after__Init : ['1.202', '0.1387', '1.800', '0.1615', '1.801', '0.0758', '7.000', '0.7076', 1, 1, 1, 1, 1725526087.7133234]
VI_at__the_End : ['1.202', '0.5013', '1.800', '0.1412', '1.800', '0.1119', '7.000', '0.7082', 1, 1, 1, 1, 1725526153.9112809]