TEST_NAME : Wafer
TEST_DATE : 24_09_05-10_46_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-007-015-00 | FUSED_ID : 6359364768394932464
  IC_TEMP :  -49.51 | VDDM : 1135.86 | AUX_INT :   -6.23 | CsaBias :   83.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.70269e-04 / 2
  ADC_P0  : -6.22641e-03 ± 1.87912e-02
  ADC_P1  : 8.20377e-03 ± 4.61569e-04
  ADC_P2  : -5.11457e-06 ± 2.24043e-06
  CSA_Chi2/NDF : 9.04513e-05 / 2
  CSA_P0  : 5.94147e-02 ± 6.34351e-03
  CSA_P1  : 9.69857e-03 ± 4.77938e-04
  CSA_P2  : -4.28766e-05 ± 7.27843e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [8, 15, 36, 47, 52, 103, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [32, 36, 50, 80]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2697', '1.800', '0.1540', '1.800', '0.0856', '7.000', '0.7076', 1, 1, 1, 1, 1725525983.377277]
VI_after__Init : ['1.202', '0.2698', '1.800', '0.1540', '1.800', '0.0804', '7.000', '0.7076', 1, 1, 1, 1, 1725525991.5356152]
VI_at__the_End : ['1.202', '0.4969', '1.800', '0.1391', '1.802', '0.1107', '7.000', '0.7081', 1, 1, 1, 1, 1725526059.0034015]