TEST_NAME : Wafer
TEST_DATE : 24_09_05-10_39_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x3 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-007-019-07 | FUSED_ID : 6359364768394932535
  IC_TEMP :  -47.60 | VDDM : 1130.93 | AUX_INT :   -9.38 | CsaBias :   89.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47439e-03 / 2
  ADC_P0  : -9.38093e-03 ± 2.60359e-02
  ADC_P1  : 8.32993e-03 ± 6.31587e-04
  ADC_P2  : -5.73136e-06 ± 3.04953e-06
  CSA_Chi2/NDF : 1.05411e-04 / 2
  CSA_P0  : 6.08763e-02 ± 6.84803e-03
  CSA_P1  : 9.74993e-03 ± 5.15949e-04
  CSA_P2  : -4.36675e-05 ± 7.85730e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [74, 97, 99, 115, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [12, 18, 112, 115, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1833', '1.800', '0.1700', '1.800', '0.0851', '7.000', '0.7072', 1, 1, 1, 1, 1725525596.5686738]
VI_after__Init : ['1.202', '0.1832', '1.800', '0.1700', '1.799', '0.0794', '7.000', '0.7072', 1, 1, 1, 1, 1725525605.4040184]
VI_at__the_End : ['1.202', '0.4994', '1.800', '0.1394', '1.799', '0.1107', '7.000', '0.7082', 1, 1, 1, 1, 1725525672.4490097]