TEST_NAME : Wafer
TEST_DATE : 24_09_05-11_08_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-008-003-04 | FUSED_ID : 6359364768394936372
  IC_TEMP :  -55.70 | VDDM : 1128.32 | AUX_INT :   -6.01 | CsaBias :   77.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01626e-03 / 2
  ADC_P0  : -6.00693e-03 ± 2.16083e-02
  ADC_P1  : 8.41183e-03 ± 5.43796e-04
  ADC_P2  : -5.36157e-06 ± 2.70645e-06
  CSA_Chi2/NDF : 1.75032e-04 / 2
  CSA_P0  : 6.06258e-02 ± 8.82431e-03
  CSA_P1  : 1.00613e-02 ± 6.64848e-04
  CSA_P2  : -4.92883e-05 ± 1.01248e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [4, 14, 32, 33, 34, 41, 42, 52, 53, 71, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [4, 48, 55, 56, 62, 82, 84, 98, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3385', '1.800', '0.1536', '1.799', '0.0934', '7.000', '0.7072', 1, 1, 1, 1, 1725527333.350938]
VI_after__Init : ['1.202', '0.3386', '1.800', '0.1537', '1.801', '0.0877', '7.000', '0.7073', 1, 1, 1, 1, 1725527341.48332]
VI_at__the_End : ['1.202', '0.4953', '1.800', '0.1403', '1.804', '0.1140', '7.000', '0.7079', 1, 1, 1, 1, 1725527408.6789832]