TEST_NAME : Wafer
TEST_DATE : 24_09_05-11_13_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-008-006-04 | FUSED_ID : 6359364768394936420
  IC_TEMP :  -54.48 | VDDM : 1129.57 | AUX_INT :   -8.02 | CsaBias :   68.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29143e-03 / 2
  ADC_P0  : -8.01660e-03 ± 2.43511e-02
  ADC_P1  : 8.58049e-03 ± 6.09593e-04
  ADC_P2  : -6.34687e-06 ± 3.01673e-06
  CSA_Chi2/NDF : 1.34627e-04 / 2
  CSA_P0  : 5.93022e-02 ± 7.73906e-03
  CSA_P1  : 9.93439e-03 ± 5.83082e-04
  CSA_P2  : -4.79649e-05 ± 8.87966e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [1, 16, 24, 32, 42, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [24, 35, 41, 59, 76, 93, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4038', '1.800', '0.1624', '1.800', '0.0933', '7.000', '0.7071', 1, 1, 1, 1, 1725527623.0592482]
VI_after__Init : ['1.202', '0.4038', '1.800', '0.1624', '1.800', '0.0876', '7.000', '0.7069', 1, 1, 1, 1, 1725527631.2346232]
VI_at__the_End : ['1.202', '0.4913', '1.800', '0.1401', '1.800', '0.1129', '7.000', '0.7076', 1, 1, 1, 1, 1725527689.9800956]