TEST_NAME : Wafer
TEST_DATE : 24_09_05-11_15_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-008-007-04 | FUSED_ID : 6359364768394936436
  IC_TEMP :  -51.99 | VDDM : 1124.05 | AUX_INT :   -8.63 | CsaBias :   66.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26636e-03 / 2
  ADC_P0  : -8.62972e-03 ± 2.41199e-02
  ADC_P1  : 8.39291e-03 ± 5.95219e-04
  ADC_P2  : -5.61124e-06 ± 2.91895e-06
  CSA_Chi2/NDF : 1.03882e-04 / 2
  CSA_P0  : 6.10075e-02 ± 6.79818e-03
  CSA_P1  : 9.76831e-03 ± 5.12194e-04
  CSA_P2  : -4.40486e-05 ± 7.80010e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [113, 122, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [1, 69, 85, 90, 102, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1793', '1.800', '0.1418', '1.800', '0.0831', '7.000', '0.7072', 1, 1, 1, 1, 1725527719.352926]
VI_after__Init : ['1.202', '0.1792', '1.800', '0.1418', '1.799', '0.0774', '7.000', '0.7070', 1, 1, 1, 1, 1725527727.4542003]
VI_at__the_End : ['1.202', '0.4980', '1.800', '0.1382', '1.800', '0.1107', '7.000', '0.7076', 1, 1, 1, 1, 1725527788.6914082]