TEST_NAME : Wafer
TEST_DATE : 24_09_05-11_16_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-008-008-04 | FUSED_ID : 6359364768394936452
  IC_TEMP :  -53.59 | VDDM : 1128.10 | AUX_INT :   -7.83 | CsaBias :   67.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16274e-03 / 2
  ADC_P0  : -7.83302e-03 ± 2.30597e-02
  ADC_P1  : 8.40082e-03 ± 5.60977e-04
  ADC_P2  : -6.10234e-06 ± 2.71267e-06
  CSA_Chi2/NDF : 9.11512e-05 / 2
  CSA_P0  : 6.01787e-02 ± 6.36801e-03
  CSA_P1  : 9.79618e-03 ± 4.79783e-04
  CSA_P2  : -4.55827e-05 ± 7.30653e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [32, 37, 52, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [57, 61, 75, 90, 107, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2855', '1.800', '0.1732', '1.800', '0.0929', '7.000', '0.7071', 1, 1, 1, 1, 1725527816.4772403]
VI_after__Init : ['1.202', '0.2851', '1.800', '0.1731', '1.801', '0.0876', '7.000', '0.7072', 1, 1, 1, 1, 1725527824.613611]
VI_at__the_End : ['1.202', '0.4931', '1.800', '0.1405', '1.810', '0.1116', '7.000', '0.7077', 1, 1, 1, 1, 1725527885.023016]