TEST_NAME : Wafer
TEST_DATE : 24_09_05-11_23_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-008-012-04 | FUSED_ID : 6359364768394936516
  IC_TEMP :  -50.60 | VDDM : 1131.67 | AUX_INT :   -6.70 | CsaBias :   83.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.59897e-04 / 2
  ADC_P0  : -6.70364e-03 ± 1.86560e-02
  ADC_P1  : 8.24186e-03 ± 4.57280e-04
  ADC_P2  : -5.23857e-06 ± 2.22177e-06
  CSA_Chi2/NDF : 1.34597e-04 / 2
  CSA_P0  : 6.02805e-02 ± 7.73819e-03
  CSA_P1  : 9.86006e-03 ± 5.83017e-04
  CSA_P2  : -4.64784e-05 ± 8.87866e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [18, 31, 46, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [23, 31, 34, 76, 82, 84, 97, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2491', '1.800', '0.1471', '1.800', '0.0839', '7.000', '0.7069', 1, 1, 1, 1, 1725528203.9572976]
VI_after__Init : ['1.202', '0.2492', '1.800', '0.1471', '1.799', '0.0787', '7.000', '0.7067', 1, 1, 1, 1, 1725528212.2526581]
VI_at__the_End : ['1.201', '0.4980', '1.800', '0.1414', '1.807', '0.1108', '7.000', '0.7073', 1, 1, 1, 1, 1725528280.4473455]