TEST_NAME : Wafer
TEST_DATE : 24_09_05-11_26_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-008-014-04 | FUSED_ID : 6359364768394936548
  IC_TEMP :  -47.03 | VDDM : 1102.53 | AUX_INT :   -7.35 | CsaBias :   68.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.68341e-04 / 2
  ADC_P0  : -7.35065e-03 ± 1.99341e-02
  ADC_P1  : 8.43134e-03 ± 4.96113e-04
  ADC_P2  : -5.68077e-06 ± 2.44834e-06
  CSA_Chi2/NDF : 1.64407e-04 / 2
  CSA_P0  : 5.94379e-02 ± 8.55228e-03
  CSA_P1  : 1.00851e-02 ± 6.44353e-04
  CSA_P2  : -5.03676e-05 ± 9.81273e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [1, 2, 11, 66, 80, 85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [12, 60, 81, 94, 115, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3254', '1.800', '0.1878', '1.799', '0.0901', '7.000', '0.7067', 1, 1, 1, 1, 1725528397.4274373]
VI_after__Init : ['1.202', '0.3257', '1.800', '0.1878', '1.800', '0.0845', '7.000', '0.7067', 1, 1, 1, 1, 1725528405.6278212]
VI_at__the_End : ['1.202', '0.4912', '1.800', '0.1409', '1.800', '0.1115', '7.000', '0.7075', 1, 1, 1, 1, 1725528464.1931403]