TEST_NAME : Wafer
TEST_DATE : 24_09_05-11_31_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-008-017-03 | FUSED_ID : 6359364768394936595
  IC_TEMP :  -49.59 | VDDM : 1129.42 | AUX_INT :   -7.45 | CsaBias :   83.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11979e-03 / 2
  ADC_P0  : -7.45412e-03 ± 2.26470e-02
  ADC_P1  : 8.34660e-03 ± 5.53943e-04
  ADC_P2  : -5.70505e-06 ± 2.69127e-06
  CSA_Chi2/NDF : 1.25673e-04 / 2
  CSA_P0  : 6.01641e-02 ± 7.47726e-03
  CSA_P1  : 9.82898e-03 ± 5.63358e-04
  CSA_P2  : -4.45556e-05 ± 8.57927e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [15, 22, 44, 57, 66, 67, 68, 73, 74, 85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [2, 17, 21, 99, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3397', '1.800', '0.1674', '1.800', '0.0954', '7.000', '0.7069', 1, 1, 1, 1, 1725528687.3460977]
VI_after__Init : ['1.202', '0.3398', '1.800', '0.1675', '1.800', '0.0900', '7.000', '0.7066', 1, 1, 1, 1, 1725528695.4413874]
VI_at__the_End : ['1.202', '0.5010', '1.800', '0.1384', '1.804', '0.1106', '7.000', '0.7073', 1, 1, 1, 1, 1725528763.3983076]