TEST_NAME : Wafer
TEST_DATE : 24_09_05-11_33_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-008-018-03 | FUSED_ID : 6359364768394936611
  IC_TEMP :  -46.67 | VDDM : 1129.12 | AUX_INT :   -7.07 | CsaBias :   80.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32540e-03 / 2
  ADC_P0  : -7.06768e-03 ± 2.47304e-02
  ADC_P1  : 8.02485e-03 ± 5.97310e-04
  ADC_P2  : -4.48112e-06 ± 2.86636e-06
  CSA_Chi2/NDF : 1.07695e-04 / 2
  CSA_P0  : 6.05356e-02 ± 6.92181e-03
  CSA_P1  : 1.00642e-02 ± 5.21508e-04
  CSA_P2  : -4.76486e-05 ± 7.94195e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [17, 21, 31, 40, 92, 113, 115, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [1, 10, 20, 41, 72, 76, 93, 102, 105, 116, 123, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1837', '1.800', '0.1651', '1.800', '0.0851', '7.000', '0.7066', 1, 1, 1, 1, 1725528784.066705]
VI_after__Init : ['1.202', '0.1838', '1.800', '0.1650', '1.799', '0.0795', '7.000', '0.7066', 1, 1, 1, 1, 1725528792.242202]
VI_at__the_End : ['1.202', '0.5011', '1.800', '0.1391', '1.807', '0.1117', '7.000', '0.7073', 1, 1, 1, 1, 1725528859.3310761]