TEST_NAME : Wafer
TEST_DATE : 24_09_05-11_34_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x3 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-008-019-03 | FUSED_ID : 6359364768394936627
  IC_TEMP :  -52.82 | VDDM : 1130.48 | AUX_INT :   -8.67 | CsaBias :   76.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18354e-03 / 2
  ADC_P0  : -8.67241e-03 ± 2.32651e-02
  ADC_P1  : 8.57548e-03 ± 5.75925e-04
  ADC_P2  : -6.54098e-06 ± 2.82601e-06
  CSA_Chi2/NDF : 1.06867e-04 / 2
  CSA_P0  : 6.29233e-02 ± 6.89516e-03
  CSA_P1  : 9.82167e-03 ± 5.19500e-04
  CSA_P2  : -4.55133e-05 ± 7.91138e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [8, 37, 45, 75, 117, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [39, 73, 77, 78, 100, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3647', '1.800', '0.1541', '1.799', '0.0894', '7.000', '0.7069', 1, 1, 1, 1, 1725528880.0654516]
VI_after__Init : ['1.202', '0.3648', '1.800', '0.1542', '1.801', '0.0836', '7.000', '0.7067', 1, 1, 1, 1, 1725528888.2429008]
VI_at__the_End : ['1.202', '0.4952', '1.800', '0.1399', '1.799', '0.1119', '7.000', '0.7076', 1, 1, 1, 1, 1725528954.2779505]