TEST_NAME : Wafer
TEST_DATE : 24_09_05-11_37_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-008-021-03 | FUSED_ID : 6359364768394936659
  IC_TEMP :  -53.71 | VDDM : 1130.56 | AUX_INT :  -10.20 | CsaBias :   81.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.77034e-03 / 2
  ADC_P0  : -1.01964e-02 ± 2.85507e-02
  ADC_P1  : 8.40739e-03 ± 6.94969e-04
  ADC_P2  : -5.93708e-06 ± 3.37108e-06
  CSA_Chi2/NDF : 1.27971e-04 / 2
  CSA_P0  : 6.13432e-02 ± 7.54532e-03
  CSA_P1  : 1.00739e-02 ± 5.68485e-04
  CSA_P2  : -4.71685e-05 ± 8.65736e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [17, 41, 52, 60, 66, 86, 97, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [43, 78]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2795', '1.800', '0.1508', '1.800', '0.0936', '7.000', '0.7069', 1, 1, 1, 1, 1725529072.5279222]
VI_after__Init : ['1.202', '0.2798', '1.800', '0.1508', '1.801', '0.0881', '7.000', '0.7069', 1, 1, 1, 1, 1725529081.3132944]
VI_at__the_End : ['1.201', '0.5042', '1.800', '0.1386', '1.799', '0.1119', '7.000', '0.7080', 1, 1, 1, 1, 1725529146.4843047]