TEST_NAME : Wafer
TEST_DATE : 24_09_05-12_29_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-009-002-09 | FUSED_ID : 6359364768394940457
  IC_TEMP :  -71.97 | VDDM : 1204.12 | AUX_INT : -850.53 | CsaBias : -649.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.60405e-02 / 2
  ADC_P0  : -8.50528e-01 ± 3.27075e-01
  ADC_P1  : 2.28331e-02 ± 6.90391e-03
  ADC_P2  : -5.85897e-05 ± 2.99316e-05
  CSA_Chi2/NDF : 1.88421e-04 / 2
  CSA_P0  : 6.13727e-02 ± 9.15560e-03
  CSA_P1  : 1.04727e-02 ± 6.89809e-04
  CSA_P2  : -5.25121e-05 ± 1.05050e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [18, 22, 23, 44, 56, 76, 88, 99, 104, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [12, 57, 66, 72, 74, 79, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2371', '1.800', '0.1288', '1.800', '0.0800', '7.000', '0.7073', 1, 1, 1, 1, 1725532159.421497]
VI_after__Init : ['1.202', '0.2371', '1.800', '0.1288', '1.800', '0.0743', '7.000', '0.7069', 1, 1, 1, 1, 1725532167.6848612]
VI_at__the_End : ['1.202', '0.5079', '1.800', '0.1449', '1.803', '0.1134', '7.000', '0.7079', 1, 1, 1, 1, 1725532232.5098572]