TEST_NAME : Wafer
TEST_DATE : 24_09_05-12_05_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-009-017-14 | FUSED_ID : 6359364768394940702
  IC_TEMP :  -50.33 | VDDM : 1126.28 | AUX_INT :   -8.37 | CsaBias :   76.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09682e-03 / 2
  ADC_P0  : -8.36783e-03 ± 2.24282e-02
  ADC_P1  : 8.49802e-03 ± 5.61970e-04
  ADC_P2  : -5.61811e-06 ± 2.80238e-06
  CSA_Chi2/NDF : 1.44129e-04 / 2
  CSA_P0  : 6.06116e-02 ± 8.00751e-03
  CSA_P1  : 1.03606e-02 ± 6.03308e-04
  CSA_P2  : -5.09731e-05 ± 9.18767e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [5, 24, 42, 67, 76, 78, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [4, 9, 15, 30, 37, 49, 74]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2860', '1.800', '0.1483', '1.800', '0.0933', '7.000', '0.7082', 1, 1, 1, 1, 1725530708.9416482]
VI_after__Init : ['1.202', '0.2860', '1.800', '0.1482', '1.800', '0.0859', '7.000', '0.7074', 1, 1, 1, 1, 1725530716.9630146]
VI_at__the_End : ['1.202', '0.5068', '1.800', '0.1404', '1.800', '0.1108', '7.000', '0.7079', 1, 1, 1, 1, 1725530784.70788]