TEST_NAME : Wafer
TEST_DATE : 24_09_05-12_00_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-009-020-14 | FUSED_ID : 6359364768394940750
  IC_TEMP :  -52.73 | VDDM : 1129.72 | AUX_INT :   -6.35 | CsaBias :   70.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.70449e-04 / 2
  ADC_P0  : -6.35412e-03 ± 1.99678e-02
  ADC_P1  : 8.56540e-03 ± 5.06956e-04
  ADC_P2  : -6.00833e-06 ± 2.53685e-06
  CSA_Chi2/NDF : 1.00732e-04 / 2
  CSA_P0  : 6.15647e-02 ± 6.69432e-03
  CSA_P1  : 1.01488e-02 ± 5.04369e-04
  CSA_P2  : -4.90777e-05 ± 7.68094e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [12, 84, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [13, 42, 50, 68, 73, 89, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3026', '1.800', '0.1272', '1.799', '0.0894', '7.000', '0.7086', 1, 1, 1, 1, 1725530419.422897]
VI_after__Init : ['1.202', '0.3027', '1.800', '0.1272', '1.802', '0.0820', '7.000', '0.7076', 1, 1, 1, 1, 1725530427.617219]
VI_at__the_End : ['1.202', '0.5008', '1.800', '0.1396', '1.803', '0.1118', '7.000', '0.7085', 1, 1, 1, 1, 1725530495.435099]