TEST_NAME : Wafer
TEST_DATE : 24_09_05-11_58_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-009-021-14 | FUSED_ID : 6359364768394940766
  IC_TEMP :  -53.33 | VDDM : 1128.50 | AUX_INT :   -4.76 | CsaBias :   62.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.66575e-04 / 2
  ADC_P0  : -4.75929e-03 ± 1.87592e-02
  ADC_P1  : 8.48717e-03 ± 4.80573e-04
  ADC_P2  : -5.29202e-06 ± 2.43030e-06
  CSA_Chi2/NDF : 1.31618e-04 / 2
  CSA_P0  : 6.08611e-02 ± 7.65210e-03
  CSA_P1  : 1.03065e-02 ± 5.76530e-04
  CSA_P2  : -5.01169e-05 ± 8.77987e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [35, 57, 91, 98, 102, 107, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [20, 45, 58, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4123', '1.800', '0.1838', '1.800', '0.1001', '7.000', '0.7079', 1, 1, 1, 1, 1725530323.541187]
VI_after__Init : ['1.202', '0.4125', '1.800', '0.1839', '1.800', '0.0946', '7.000', '0.7078', 1, 1, 1, 1, 1725530331.7115943]
VI_at__the_End : ['1.202', '0.5072', '1.800', '0.1416', '1.804', '0.1132', '7.000', '0.7083', 1, 1, 1, 1, 1725530391.4440253]