TEST_NAME : Wafer
TEST_DATE : 24_09_05-11_53_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-009-024-14 | FUSED_ID : 6359364768394940814
  IC_TEMP :  -47.95 | VDDM : 1129.84 | AUX_INT :   -6.98 | CsaBias :   80.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01086e-03 / 2
  ADC_P0  : -6.97677e-03 ± 2.15818e-02
  ADC_P1  : 7.97402e-03 ± 5.19539e-04
  ADC_P2  : -4.40195e-06 ± 2.48176e-06
  CSA_Chi2/NDF : 9.83133e-05 / 2
  CSA_P0  : 5.81060e-02 ± 6.61346e-03
  CSA_P1  : 9.71874e-03 ± 4.98276e-04
  CSA_P2  : -4.17728e-05 ± 7.58816e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 20, 32, 42, 60, 61, 85, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [41, 43, 58, 69, 80, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1253', '1.800', '0.1865', '1.800', '0.0823', '7.000', '0.7079', 1, 1, 1, 1, 1725530032.510653]
VI_after__Init : ['1.202', '0.1254', '1.800', '0.1865', '1.800', '0.0770', '7.000', '0.7076', 1, 1, 1, 1, 1725530041.318931]
VI_at__the_End : ['1.202', '0.5011', '1.800', '0.1373', '1.809', '0.1119', '7.000', '0.7084', 1, 1, 1, 1, 1725530108.9216774]