TEST_NAME : Wafer
TEST_DATE : 24_09_05-11_50_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-009-026-14 | FUSED_ID : 6359364768394940846
  IC_TEMP :  -57.61 | VDDM : 1129.92 | AUX_INT :   -6.58 | CsaBias :   72.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.57685e-04 / 2
  ADC_P0  : -6.58301e-03 ± 2.09250e-02
  ADC_P1  : 8.79297e-03 ± 5.38537e-04
  ADC_P2  : -6.58608e-06 ± 2.74134e-06
  CSA_Chi2/NDF : 1.70279e-04 / 2
  CSA_P0  : 6.14748e-02 ± 8.70369e-03
  CSA_P1  : 1.02652e-02 ± 6.55760e-04
  CSA_P2  : -5.12427e-05 ± 9.98645e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [9, 16, 21, 39, 58, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [16, 18, 24, 31, 39, 56, 109, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2559', '1.800', '0.1577', '1.800', '0.0856', '7.000', '0.7076', 1, 1, 1, 1, 1725529839.4953222]
VI_after__Init : ['1.202', '0.2560', '1.800', '0.1576', '1.800', '0.0798', '7.000', '0.7073', 1, 1, 1, 1, 1725529847.7287588]
VI_at__the_End : ['1.202', '0.5004', '1.800', '0.1384', '1.801', '0.1143', '7.000', '0.7085', 1, 1, 1, 1, 1725529907.5841367]