TEST_NAME : Wafer
TEST_DATE : 24_09_05-12_34_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-010-004-07 | FUSED_ID : 6359364768394944583
  IC_TEMP :  -51.08 | VDDM : 1105.39 | AUX_INT :  -10.85 | CsaBias :   74.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.88415e-03 / 2
  ADC_P0  : -1.08458e-02 ± 2.94521e-02
  ADC_P1  : 8.59569e-03 ± 7.30235e-04
  ADC_P2  : -6.18956e-06 ± 3.61808e-06
  CSA_Chi2/NDF : 1.38568e-04 / 2
  CSA_P0  : 6.11920e-02 ± 7.85151e-03
  CSA_P1  : 1.01646e-02 ± 5.91555e-04
  CSA_P2  : -4.87528e-05 ± 9.00868e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 21, 43, 58, 70]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [4, 21, 34, 67, 111, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3823', '1.800', '0.1589', '1.799', '0.0920', '7.000', '0.7072', 1, 1, 1, 1, 1725532448.4952416]
VI_after__Init : ['1.202', '0.3823', '1.800', '0.1589', '1.800', '0.0868', '7.000', '0.7074', 1, 1, 1, 1, 1725532456.7136602]
VI_at__the_End : ['1.201', '0.5018', '1.800', '0.1421', '1.804', '0.1113', '7.000', '0.7082', 1, 1, 1, 1, 1725532522.4456398]