TEST_NAME : Wafer
TEST_DATE : 24_09_05-12_37_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-010-006-07 | FUSED_ID : 6359364768394944615
  IC_TEMP :  -50.18 | VDDM : 1126.36 | AUX_INT :   -7.15 | CsaBias :   67.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.35570e-04 / 2
  ADC_P0  : -7.15244e-03 ± 1.95419e-02
  ADC_P1  : 8.30352e-03 ± 4.74854e-04
  ADC_P2  : -5.84951e-06 ± 2.28377e-06
  CSA_Chi2/NDF : 9.65539e-05 / 2
  CSA_P0  : 6.00496e-02 ± 6.55401e-03
  CSA_P1  : 9.71519e-03 ± 4.93797e-04
  CSA_P2  : -4.21373e-05 ± 7.51995e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [6, 8, 10, 28, 29]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [27, 53, 63, 64, 65, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3765', '1.800', '0.1418', '1.800', '0.0917', '7.000', '0.7074', 1, 1, 1, 1, 1725532640.9315329]
VI_after__Init : ['1.202', '0.3765', '1.800', '0.1418', '1.801', '0.0860', '7.000', '0.7077', 1, 1, 1, 1, 1725532648.9709527]
VI_at__the_End : ['1.202', '0.4984', '1.800', '0.1415', '1.799', '0.1107', '7.000', '0.7083', 1, 1, 1, 1, 1725532709.8451576]