TEST_NAME : Wafer
TEST_DATE : 24_09_05-12_40_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.1
  ASIC_ID : XA-000-09-004-021-010-008-07 | FUSED_ID : 6359364768394944647
  IC_TEMP :  -82.22 | VDDM :  939.45 | AUX_INT :  924.72 | CsaBias : 1220.70
  CONF_FAIL_REG : 1958
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.67901e-01 / 2
  ADC_P0  : -3.81574e+00 ± 4.17347e+00
  ADC_P1  : 5.97530e-02 ± 5.19486e-02
  ADC_P2  : -1.76586e-04 ± 1.50115e-04
  CSA_Chi2/NDF : 5.77238e-03 / 2
  CSA_P0  : 1.42173e-01 ± 5.06757e-02
  CSA_P1  : -1.89551e-03 ± 3.81805e-03
  CSA_P2  : 7.52977e-05 ± 5.81444e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [25, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [42, 47, 51, 70, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.5067', '1.800', '0.2024', '1.696', '0.1501', '7.000', '0.7076', 1, 1, 1, 1, 1725532833.6926186]
VI_after__Init : ['1.202', '0.5071', '1.800', '0.2085', '1.696', '0.1501', '7.000', '0.7076', 1, 1, 1, 1, 1725532841.8609352]
VI_at__the_End : ['1.202', '0.3472', '1.800', '0.1996', '1.691', '0.1501', '7.000', '0.7083', 1, 1, 1, 1, 1725532904.1889422]