TEST_NAME : Wafer
TEST_DATE : 24_09_05-12_47_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-010-012-07 | FUSED_ID : 6359364768394944711
  IC_TEMP :  -50.92 | VDDM : 1132.51 | AUX_INT :   -8.80 | CsaBias :   73.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39379e-03 / 2
  ADC_P0  : -8.79915e-03 ± 2.53330e-02
  ADC_P1  : 8.28203e-03 ± 6.17839e-04
  ADC_P2  : -5.37575e-06 ± 2.99707e-06
  CSA_Chi2/NDF : 8.82438e-05 / 2
  CSA_P0  : 6.04005e-02 ± 6.26563e-03
  CSA_P1  : 9.37195e-03 ± 4.72070e-04
  CSA_P2  : -3.97116e-05 ± 7.18906e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [14, 61, 66, 67, 71, 93]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [42, 54, 65, 83]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1693', '1.800', '0.1485', '1.800', '0.0912', '7.000', '0.7077', 1, 1, 1, 1, 1725533220.7519834]
VI_after__Init : ['1.202', '0.1694', '1.800', '0.1485', '1.800', '0.0859', '7.000', '0.7079', 1, 1, 1, 1, 1725533228.783354]
VI_at__the_End : ['1.202', '0.4919', '1.800', '0.1398', '1.800', '0.1111', '7.000', '0.7085', 1, 1, 1, 1, 1725533291.0185168]