TEST_NAME : Wafer
TEST_DATE : 24_09_05-12_48_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-010-013-07 | FUSED_ID : 6359364768394944727
  IC_TEMP :  -48.49 | VDDM : 1133.50 | AUX_INT :   -9.26 | CsaBias :   88.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42279e-03 / 2
  ADC_P0  : -9.25589e-03 ± 2.56108e-02
  ADC_P1  : 8.24489e-03 ± 6.28728e-04
  ADC_P2  : -4.78145e-06 ± 3.08438e-06
  CSA_Chi2/NDF : 9.42510e-05 / 2
  CSA_P0  : 6.04486e-02 ± 6.47538e-03
  CSA_P1  : 9.75681e-03 ± 4.87873e-04
  CSA_P2  : -4.37676e-05 ± 7.42973e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [9, 25, 31, 68]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [1, 16, 43, 52]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2314', '1.800', '0.1793', '1.800', '0.0927', '7.000', '0.7079', 1, 1, 1, 1, 1725533317.4643342]
VI_after__Init : ['1.202', '0.2306', '1.800', '0.1793', '1.800', '0.0873', '7.000', '0.7079', 1, 1, 1, 1, 1725533325.7067752]
VI_at__the_End : ['1.202', '0.4987', '1.800', '0.1401', '1.800', '0.1093', '7.000', '0.7085', 1, 1, 1, 1, 1725533387.9369133]