TEST_NAME : Wafer
TEST_DATE : 24_09_05-12_51_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-010-015-07 | FUSED_ID : 6359364768394944759
  IC_TEMP :  -52.89 | VDDM : 1132.81 | AUX_INT :   -6.06 | CsaBias :   84.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.22027e-04 / 2
  ADC_P0  : -6.06339e-03 ± 2.05811e-02
  ADC_P1  : 8.25446e-03 ± 5.08932e-04
  ADC_P2  : -5.01255e-06 ± 2.49584e-06
  CSA_Chi2/NDF : 1.20697e-04 / 2
  CSA_P0  : 6.01811e-02 ± 7.32776e-03
  CSA_P1  : 9.98417e-03 ± 5.52094e-04
  CSA_P2  : -4.71718e-05 ± 8.40774e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [15, 22, 56, 58, 59, 65, 89, 90, 93, 96, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [11, 30, 42, 53, 63, 66, 69, 80, 88, 89, 110, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1500', '1.800', '0.1200', '1.799', '0.0823', '7.000', '0.7078', 1, 1, 1, 1, 1725533511.431311]
VI_after__Init : ['1.202', '0.1500', '1.800', '0.1201', '1.800', '0.0768', '7.000', '0.7079', 1, 1, 1, 1, 1725533519.476655]
VI_at__the_End : ['1.202', '0.4981', '1.800', '0.1431', '1.799', '0.1111', '7.000', '0.7084', 1, 1, 1, 1, 1725533581.8157182]