TEST_NAME : Wafer
TEST_DATE : 24_09_05-12_55_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-010-017-00 | FUSED_ID : 6359364768394944784
  IC_TEMP :  -50.77 | VDDM : 1129.81 | AUX_INT :   -7.23 | CsaBias :   67.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28638e-03 / 2
  ADC_P0  : -7.22967e-03 ± 2.42948e-02
  ADC_P1  : 8.41081e-03 ± 5.95674e-04
  ADC_P2  : -6.12031e-06 ± 2.88862e-06
  CSA_Chi2/NDF : 7.97387e-05 / 2
  CSA_P0  : 6.12923e-02 ± 5.95603e-03
  CSA_P1  : 9.87611e-03 ± 4.48744e-04
  CSA_P2  : -4.51560e-05 ± 6.83384e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [37, 46, 52, 81, 90, 96, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [15, 41, 67]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1422', '1.800', '0.1930', '1.800', '0.0852', '7.000', '0.7079', 1, 1, 1, 1, 1725533704.9322214]
VI_after__Init : ['1.202', '0.1422', '1.800', '0.1930', '1.800', '0.0800', '7.000', '0.7074', 1, 1, 1, 1, 1725533713.2355359]
VI_at__the_End : ['1.202', '0.4992', '1.800', '0.1393', '1.803', '0.1112', '7.000', '0.7082', 1, 1, 1, 1, 1725533780.0953946]