TEST_NAME : Wafer
TEST_DATE : 24_09_05-13_03_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-010-022-00 | FUSED_ID : 6359364768394944864
  IC_TEMP :  -53.69 | VDDM : 1127.76 | AUX_INT :   -6.83 | CsaBias :   68.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02249e-03 / 2
  ADC_P0  : -6.83319e-03 ± 2.16715e-02
  ADC_P1  : 8.42872e-03 ± 5.46065e-04
  ADC_P2  : -5.15242e-06 ± 2.73619e-06
  CSA_Chi2/NDF : 1.61185e-04 / 2
  CSA_P0  : 6.00858e-02 ± 8.46807e-03
  CSA_P1  : 1.02475e-02 ± 6.38008e-04
  CSA_P2  : -5.05734e-05 ± 9.71610e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [11, 58, 110, 121, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [11, 37, 49, 52, 78]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4092', '1.800', '0.1376', '1.800', '0.0956', '6.999', '0.7079', 1, 1, 1, 1, 1725534186.351916]
VI_after__Init : ['1.202', '0.4083', '1.800', '0.1375', '1.800', '0.0882', '7.000', '0.7070', 1, 1, 1, 1, 1725534194.4552436]
VI_at__the_End : ['1.202', '0.5004', '1.800', '0.1384', '1.801', '0.1116', '7.000', '0.7079', 1, 1, 1, 1, 1725534261.396996]