TEST_NAME : Wafer
TEST_DATE : 24_09_05-13_04_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-010-023-00 | FUSED_ID : 6359364768394944880
  IC_TEMP :  -53.53 | VDDM : 1128.96 | AUX_INT :   -7.87 | CsaBias :   78.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04422e-03 / 2
  ADC_P0  : -7.87047e-03 ± 2.18843e-02
  ADC_P1  : 8.67401e-03 ± 5.58227e-04
  ADC_P2  : -6.07893e-06 ± 2.82594e-06
  CSA_Chi2/NDF : 1.19474e-04 / 2
  CSA_P0  : 5.92817e-02 ± 7.29053e-03
  CSA_P1  : 1.00280e-02 ± 5.49289e-04
  CSA_P2  : -4.80153e-05 ± 8.36502e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [0, 3, 9, 15, 31, 69, 92, 105, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [11, 13, 72, 74, 81, 86, 114, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3367', '1.800', '0.1791', '1.799', '0.0949', '7.000', '0.7071', 1, 1, 1, 1, 1725534282.7694056]
VI_after__Init : ['1.202', '0.3367', '1.800', '0.1791', '1.800', '0.0895', '7.000', '0.7069', 1, 1, 1, 1, 1725534290.836939]
VI_at__the_End : ['1.202', '0.4974', '1.800', '0.1382', '1.800', '0.1129', '7.000', '0.7077', 1, 1, 1, 1, 1725534356.2357867]