TEST_NAME : Wafer
TEST_DATE : 24_09_05-13_07_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-010-025-00 | FUSED_ID : 6359364768394944912
  IC_TEMP :  -48.67 | VDDM : 1122.76 | AUX_INT :   -6.10 | CsaBias :   74.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.44995e-04 / 2
  ADC_P0  : -6.10148e-03 ± 2.08222e-02
  ADC_P1  : 8.12881e-03 ± 5.02791e-04
  ADC_P2  : -5.18520e-06 ± 2.40333e-06
  CSA_Chi2/NDF : 1.14256e-04 / 2
  CSA_P0  : 5.96234e-02 ± 7.12955e-03
  CSA_P1  : 9.88462e-03 ± 5.37160e-04
  CSA_P2  : -4.36346e-05 ± 8.18031e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [1, 20, 28, 37, 45, 54, 81, 83, 112, 116, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [38, 43, 49, 58, 60, 97, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3021', '1.800', '0.1725', '1.800', '0.0300', '7.000', '0.7050', 1, 1, 1, 1, 1725534469.7609584]
VI_after__Init : ['1.202', '0.3021', '1.800', '0.1725', '1.800', '0.0817', '7.000', '0.7069', 1, 1, 1, 1, 1725534478.4783063]
VI_at__the_End : ['1.202', '0.5055', '1.800', '0.1359', '1.801', '0.1101', '7.000', '0.7078', 1, 1, 1, 1, 1725534544.3342962]