TEST_NAME : Wafer
TEST_DATE : 24_09_05-13_09_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-010-026-00 | FUSED_ID : 6359364768394944928
  IC_TEMP :  -48.80 | VDDM : 1127.11 | AUX_INT :  -26.06 | CsaBias :   59.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47179e-03 / 2
  ADC_P0  : -2.60644e-02 ± 2.69408e-02
  ADC_P1  : 8.65451e-03 ± 6.59636e-04
  ADC_P2  : -6.44451e-06 ± 3.20906e-06
  CSA_Chi2/NDF : 1.19076e-04 / 2
  CSA_P0  : 5.99465e-02 ± 7.27838e-03
  CSA_P1  : 1.00879e-02 ± 5.48373e-04
  CSA_P2  : -4.64199e-05 ± 8.35107e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 1, 32, 71, 72, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [64, 71, 81, 92, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4888', '1.800', '0.1424', '1.800', '0.0904', '7.000', '0.7071', 1, 1, 1, 1, 1725534566.49765]
VI_after__Init : ['1.202', '0.4889', '1.800', '0.1425', '1.800', '0.0849', '7.000', '0.7068', 1, 1, 1, 1, 1725534575.2618968]
VI_at__the_End : ['1.202', '0.5067', '1.800', '0.1390', '1.800', '0.1100', '7.000', '0.7078', 1, 1, 1, 1, 1725534633.719379]