TEST_NAME : Wafer
TEST_DATE : 24_09_05-13_11_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-010-027-00 | FUSED_ID : 6359364768394944944
  IC_TEMP :  -51.27 | VDDM : 1128.67 | AUX_INT :   -7.71 | CsaBias :   75.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17867e-03 / 2
  ADC_P0  : -7.71343e-03 ± 2.32802e-02
  ADC_P1  : 8.36565e-03 ± 5.75732e-04
  ADC_P2  : -5.56229e-06 ± 2.82067e-06
  CSA_Chi2/NDF : 1.09809e-04 / 2
  CSA_P0  : 5.79788e-02 ± 6.98941e-03
  CSA_P1  : 1.00714e-02 ± 5.26602e-04
  CSA_P2  : -4.69802e-05 ± 8.01952e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [3, 26, 38, 45, 50, 65, 75, 113, 116, 118, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 5, 55, 69, 116, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1344', '1.800', '0.1575', '1.800', '0.0810', '7.000', '0.7072', 1, 1, 1, 1, 1725534663.5260804]
VI_after__Init : ['1.202', '0.1345', '1.800', '0.1576', '1.800', '0.0751', '7.000', '0.7069', 1, 1, 1, 1, 1725534672.2895036]
VI_at__the_End : ['1.202', '0.4999', '1.800', '0.1353', '1.800', '0.1102', '7.000', '0.7077', 1, 1, 1, 1, 1725534739.9741726]