TEST_NAME : Wafer
TEST_DATE : 24_09_05-13_52_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-011-002-10 | FUSED_ID : 6359364768394948650
  IC_TEMP :  -53.31 | VDDM : 1133.35 | AUX_INT :   -6.37 | CsaBias :   70.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.26643e-04 / 2
  ADC_P0  : -6.36923e-03 ± 2.05697e-02
  ADC_P1  : 8.65147e-03 ± 5.16494e-04
  ADC_P2  : -6.72729e-06 ± 2.56018e-06
  CSA_Chi2/NDF : 1.20921e-04 / 2
  CSA_P0  : 5.97010e-02 ± 7.33455e-03
  CSA_P1  : 1.02328e-02 ± 5.52605e-04
  CSA_P2  : -4.78912e-05 ± 8.41553e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [1, 12, 31, 79, 100, 106, 112, 114, 115, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [63, 123, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3134', '1.800', '0.1293', '1.800', '0.0925', '7.000', '0.7079', 1, 1, 1, 1, 1725537163.9168203]
VI_after__Init : ['1.202', '0.3134', '1.800', '0.1292', '1.800', '0.0844', '7.000', '0.7070', 1, 1, 1, 1, 1725537172.0021672]
VI_at__the_End : ['1.202', '0.5113', '1.800', '0.1441', '1.802', '0.1099', '7.000', '0.7078', 1, 1, 1, 1, 1725537238.40906]