TEST_NAME : Wafer
TEST_DATE : 24_09_05-13_44_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-011-007-10 | FUSED_ID : 6359364768394948730
  IC_TEMP :  -59.10 | VDDM : 1125.00 | AUX_INT :   -6.97 | CsaBias :   60.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22465e-03 / 2
  ADC_P0  : -6.97412e-03 ± 2.37462e-02
  ADC_P1  : 8.47543e-03 ± 6.01724e-04
  ADC_P2  : -5.27140e-06 ± 3.02652e-06
  CSA_Chi2/NDF : 1.77987e-04 / 2
  CSA_P0  : 6.09377e-02 ± 8.89850e-03
  CSA_P1  : 1.07547e-02 ± 6.70438e-04
  CSA_P2  : -6.06090e-05 ± 1.02100e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [22, 40, 43, 87, 89, 122, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [11, 15, 63, 117, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3306', '1.800', '0.1780', '1.799', '0.0919', '7.000', '0.7076', 1, 1, 1, 1, 1725536681.649058]
VI_after__Init : ['1.202', '0.3306', '1.800', '0.1779', '1.801', '0.0860', '7.000', '0.7076', 1, 1, 1, 1, 1725536689.69954]
VI_at__the_End : ['1.202', '0.4923', '1.800', '0.1443', '1.800', '0.1137', '7.000', '0.7082', 1, 1, 1, 1, 1725536757.335486]