TEST_NAME : Wafer
TEST_DATE : 24_09_05-13_36_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-011-012-10 | FUSED_ID : 6359364768394948810
  IC_TEMP :  -55.43 | VDDM : 1123.48 | AUX_INT :   -9.53 | CsaBias :   67.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45048e-03 / 2
  ADC_P0  : -9.53285e-03 ± 2.57753e-02
  ADC_P1  : 8.65764e-03 ± 6.40299e-04
  ADC_P2  : -6.77120e-06 ± 3.15660e-06
  CSA_Chi2/NDF : 1.27421e-04 / 2
  CSA_P0  : 6.03405e-02 ± 7.52910e-03
  CSA_P1  : 1.01775e-02 ± 5.67263e-04
  CSA_P2  : -5.08308e-05 ± 8.63875e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 27, 48, 93, 121, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [8, 21, 32, 62, 64, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3248', '1.800', '0.1241', '1.799', '0.0854', '7.000', '0.7077', 1, 1, 1, 1, 1725536197.41258]
VI_after__Init : ['1.202', '0.3250', '1.800', '0.1245', '1.799', '0.0807', '7.000', '0.7079', 1, 1, 1, 1, 1725536206.1718714]
VI_at__the_End : ['1.202', '0.4939', '1.800', '0.1418', '1.803', '0.1115', '7.000', '0.7086', 1, 1, 1, 1, 1725536265.2763703]