TEST_NAME : Wafer
TEST_DATE : 24_09_05-13_28_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-011-017-13 | FUSED_ID : 6359364768394948893
  IC_TEMP :  -50.99 | VDDM : 1136.89 | AUX_INT :   -6.23 | CsaBias :   84.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15500e-03 / 2
  ADC_P0  : -6.22599e-03 ± 2.30627e-02
  ADC_P1  : 8.30111e-03 ± 5.73439e-04
  ADC_P2  : -5.13556e-06 ± 2.82252e-06
  CSA_Chi2/NDF : 9.75891e-05 / 2
  CSA_P0  : 5.93236e-02 ± 6.58905e-03
  CSA_P1  : 9.85164e-03 ± 4.96438e-04
  CSA_P2  : -4.48470e-05 ± 7.56016e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [27, 28, 53, 87, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 10, 40, 59, 99, 115, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4586', '1.800', '0.1833', '1.799', '0.1035', '7.000', '0.7079', 1, 1, 1, 1, 1725535720.2999864]
VI_after__Init : ['1.202', '0.4588', '1.800', '0.1833', '1.800', '0.0982', '7.000', '0.7076', 1, 1, 1, 1, 1725535728.3644276]
VI_at__the_End : ['1.202', '0.4993', '1.800', '0.1394', '1.803', '0.1104', '7.000', '0.7084', 1, 1, 1, 1, 1725535793.7005813]