TEST_NAME : Wafer
TEST_DATE : 24_09_05-13_27_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-011-018-13 | FUSED_ID : 6359364768394948909
  IC_TEMP :  -50.60 | VDDM : 1131.33 | AUX_INT :   -6.54 | CsaBias :   76.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.54584e-04 / 2
  ADC_P0  : -6.54079e-03 ± 1.85969e-02
  ADC_P1  : 8.38703e-03 ± 4.65408e-04
  ADC_P2  : -5.34134e-06 ± 2.30771e-06
  CSA_Chi2/NDF : 9.70801e-05 / 2
  CSA_P0  : 6.12300e-02 ± 6.57185e-03
  CSA_P1  : 9.99677e-03 ± 4.95141e-04
  CSA_P2  : -4.61719e-05 ± 7.54042e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [1, 8, 38, 40, 69, 81, 90, 94, 99, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.5213', '1.800', '0.1253', '1.800', '0.1188', '7.000', '0.7083', 1, 1, 1, 1, 1725535623.533988]
VI_after__Init : ['1.202', '0.5213', '1.800', '0.1253', '1.800', '0.1116', '7.000', '0.7076', 1, 1, 1, 1, 1725535631.6674361]
VI_at__the_End : ['1.202', '0.5043', '1.800', '0.1398', '1.807', '0.1103', '7.000', '0.7083', 1, 1, 1, 1, 1725535690.3110995]