TEST_NAME : Wafer
TEST_DATE : 24_09_05-13_15_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-011-025-13 | FUSED_ID : 6359364768394949021
  IC_TEMP :  -50.58 | VDDM : 1129.06 | AUX_INT :   -4.87 | CsaBias :   77.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.55989e-04 / 2
  ADC_P0  : -4.86660e-03 ± 1.59581e-02
  ADC_P1  : 8.26992e-03 ± 3.98864e-04
  ADC_P2  : -5.03646e-06 ± 1.96647e-06
  CSA_Chi2/NDF : 1.19259e-04 / 2
  CSA_P0  : 6.04357e-02 ± 7.28398e-03
  CSA_P1  : 1.00562e-02 ± 5.48795e-04
  CSA_P2  : -4.50574e-05 ± 8.35750e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [26, 30, 73, 85, 109, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [11, 36, 74, 85, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1229', '1.800', '0.1426', '1.800', '0.0835', '7.000', '0.7070', 1, 1, 1, 1, 1725534953.9070702]
VI_after__Init : ['1.202', '0.1228', '1.800', '0.1425', '1.800', '0.0778', '7.000', '0.7072', 1, 1, 1, 1, 1725534962.1475768]
VI_at__the_End : ['1.197', '0.5085', '1.800', '0.1388', '1.800', '0.1090', '7.000', '0.7080', 1, 1, 1, 1, 1725535030.9529884]