TEST_NAME : Wafer
TEST_DATE : 24_09_05-13_55_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-003-02 | FUSED_ID : 6359364768394952754
  IC_TEMP :  -49.87 | VDDM : 1133.72 | AUX_INT :   -5.34 | CsaBias :   79.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.98893e-04 / 2
  ADC_P0  : -5.34145e-03 ± 1.91356e-02
  ADC_P1  : 8.53773e-03 ± 4.87480e-04
  ADC_P2  : -5.68495e-06 ± 2.45353e-06
  CSA_Chi2/NDF : 1.22549e-04 / 2
  CSA_P0  : 5.99828e-02 ± 7.38375e-03
  CSA_P1  : 1.00315e-02 ± 5.56312e-04
  CSA_P2  : -4.56678e-05 ± 8.47197e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [35, 42, 78]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [7, 28, 40, 67, 97, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.5225', '1.800', '0.1397', '1.799', '0.0943', '7.000', '0.7070', 1, 1, 1, 1, 1725537356.8942285]
VI_after__Init : ['1.202', '0.5224', '1.800', '0.1397', '1.800', '0.0887', '7.000', '0.7069', 1, 1, 1, 1, 1725537364.976617]
VI_at__the_End : ['1.202', '0.5090', '1.800', '0.1400', '1.800', '0.1092', '7.000', '0.7076', 1, 1, 1, 1, 1725537428.3708718]