TEST_NAME : Wafer
TEST_DATE : 24_09_05-13_57_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-004-02 | FUSED_ID : 6359364768394952770
  IC_TEMP :  -53.11 | VDDM : 1111.13 | AUX_INT :   -6.65 | CsaBias :   75.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.88402e-04 / 2
  ADC_P0  : -6.65028e-03 ± 2.12930e-02
  ADC_P1  : 8.30356e-03 ± 5.23670e-04
  ADC_P2  : -5.38057e-06 ± 2.55615e-06
  CSA_Chi2/NDF : 1.89889e-04 / 2
  CSA_P0  : 6.02811e-02 ± 9.19120e-03
  CSA_P1  : 1.04007e-02 ± 6.92490e-04
  CSA_P2  : -5.17428e-05 ± 1.05458e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [19, 26, 30, 53, 68, 78, 85, 95, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [4, 18, 32, 35, 72, 99, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2124', '1.800', '0.1467', '1.800', '0.0814', '7.000', '0.7070', 1, 1, 1, 1, 1725537453.6428814]
VI_after__Init : ['1.202', '0.2124', '1.800', '0.1467', '1.800', '0.0755', '7.000', '0.7067', 1, 1, 1, 1, 1725537461.6853]
VI_at__the_End : ['1.202', '0.5033', '1.800', '0.1452', '1.800', '0.1121', '7.000', '0.7076', 1, 1, 1, 1, 1725537528.2252398]