TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_00_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-006-02 | FUSED_ID : 6359364768394952802
  IC_TEMP :  -44.62 | VDDM : 1128.56 | AUX_INT :   -6.70 | CsaBias :   87.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.69418e-04 / 2
  ADC_P0  : -6.69736e-03 ± 2.11563e-02
  ADC_P1  : 7.90219e-03 ± 5.13716e-04
  ADC_P2  : -3.72876e-06 ± 2.47882e-06
  CSA_Chi2/NDF : 1.13739e-04 / 2
  CSA_P0  : 6.05777e-02 ± 7.11339e-03
  CSA_P1  : 9.89570e-03 ± 5.35943e-04
  CSA_P2  : -4.31490e-05 ± 8.16177e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [1, 39, 49, 53, 55, 73, 89, 101, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [44, 58, 69, 72, 78, 79, 84, 107, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1275', '1.800', '0.1252', '1.800', '0.0822', '7.000', '0.7069', 1, 1, 1, 1, 1725537646.4203606]
VI_after__Init : ['1.202', '0.1275', '1.800', '0.1252', '1.800', '0.0765', '7.000', '0.7068', 1, 1, 1, 1, 1725537654.5617702]
VI_at__the_End : ['1.202', '0.5082', '1.800', '0.1420', '1.799', '0.1098', '7.000', '0.7074', 1, 1, 1, 1, 1725537720.803756]