TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_02_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-007-02 | FUSED_ID : 6359364768394952818
  IC_TEMP :  -53.27 | VDDM : 1122.79 | AUX_INT :   -8.05 | CsaBias :   75.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03779e-03 / 2
  ADC_P0  : -8.04732e-03 ± 2.18020e-02
  ADC_P1  : 8.36357e-03 ± 5.33275e-04
  ADC_P2  : -5.79174e-06 ± 2.59086e-06
  CSA_Chi2/NDF : 1.35707e-04 / 2
  CSA_P0  : 6.00382e-02 ± 7.77004e-03
  CSA_P1  : 9.96610e-03 ± 5.85416e-04
  CSA_P2  : -4.70145e-05 ± 8.91519e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [14, 22, 28, 38, 43, 54]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [22, 47, 51, 73, 87, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3131', '1.800', '0.1467', '1.800', '0.0870', '7.000', '0.7067', 1, 1, 1, 1, 1725537743.0110686]
VI_after__Init : ['1.202', '0.3132', '1.800', '0.1467', '1.800', '0.0813', '7.000', '0.7066', 1, 1, 1, 1, 1725537751.953321]
VI_at__the_End : ['1.202', '0.4955', '1.800', '0.1395', '1.803', '0.1123', '7.000', '0.7076', 1, 1, 1, 1, 1725537817.6264403]