TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_04_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-008-02 | FUSED_ID : 6359364768394952834
  IC_TEMP :  -47.81 | VDDM : 1133.60 | AUX_INT :   -5.44 | CsaBias :   75.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.50881e-04 / 2
  ADC_P0  : -5.44037e-03 ± 2.08962e-02
  ADC_P1  : 8.09908e-03 ± 5.05611e-04
  ADC_P2  : -5.11264e-06 ± 2.41443e-06
  CSA_Chi2/NDF : 9.44623e-05 / 2
  CSA_P0  : 5.92113e-02 ± 6.48264e-03
  CSA_P1  : 9.68363e-03 ± 4.88420e-04
  CSA_P2  : -4.14078e-05 ± 7.43806e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [7, 55, 92, 95, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [14, 15, 23, 24, 27, 39, 61, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2121', '1.800', '0.1606', '1.800', '0.0870', '7.000', '0.7080', 1, 1, 1, 1, 1725537839.9317257]
VI_after__Init : ['1.202', '0.2120', '1.800', '0.1606', '1.800', '0.0795', '7.000', '0.7067', 1, 1, 1, 1, 1725537847.9651346]
VI_at__the_End : ['1.202', '0.5032', '1.800', '0.1397', '1.799', '0.1100', '7.000', '0.7076', 1, 1, 1, 1, 1725537908.3135014]