TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_08_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-011-02 | FUSED_ID : 6359364768394952882
  IC_TEMP :  -46.35 | VDDM : 1130.00 | AUX_INT :   -6.17 | CsaBias :   83.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.00974e-04 / 2
  ADC_P0  : -6.17334e-03 ± 2.03511e-02
  ADC_P1  : 8.23757e-03 ± 5.04945e-04
  ADC_P2  : -4.72341e-06 ± 2.49037e-06
  CSA_Chi2/NDF : 9.86909e-05 / 2
  CSA_P0  : 6.03299e-02 ± 6.62614e-03
  CSA_P1  : 9.87972e-03 ± 4.99232e-04
  CSA_P2  : -4.39594e-05 ± 7.60271e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [31, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [33, 59, 65, 80, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2851', '1.800', '0.1318', '1.799', '0.0864', '7.000', '0.7073', 1, 1, 1, 1, 1725538128.1169834]
VI_after__Init : ['1.202', '0.2851', '1.800', '0.1318', '1.801', '0.0810', '7.000', '0.7071', 1, 1, 1, 1, 1725538136.8203769]
VI_at__the_End : ['1.202', '0.5041', '1.800', '0.1418', '1.803', '0.1101', '7.000', '0.7079', 1, 1, 1, 1, 1725538204.2322452]