TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_10_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-012-02 | FUSED_ID : 6359364768394952898
  IC_TEMP :  -47.81 | VDDM : 1135.87 | AUX_INT :   -5.75 | CsaBias :   67.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06560e-03 / 2
  ADC_P0  : -5.74958e-03 ± 2.21754e-02
  ADC_P1  : 8.23347e-03 ± 5.56264e-04
  ADC_P2  : -4.45742e-06 ± 2.76654e-06
  CSA_Chi2/NDF : 1.10054e-04 / 2
  CSA_P0  : 6.17855e-02 ± 6.99722e-03
  CSA_P1  : 9.97264e-03 ± 5.27190e-04
  CSA_P2  : -4.63495e-05 ± 8.02848e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [0, 16, 68, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [11, 14, 15, 33, 35, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2634', '1.800', '0.1784', '1.799', '0.0937', '7.000', '0.7080', 1, 1, 1, 1, 1725538225.088629]
VI_after__Init : ['1.200', '0.2630', '1.800', '0.1784', '1.801', '0.0865', '7.000', '0.7072', 1, 1, 1, 1, 1725538233.93303]
VI_at__the_End : ['1.202', '0.5024', '1.800', '0.1421', '1.804', '0.1115', '7.000', '0.7081', 1, 1, 1, 1, 1725538300.2369337]