TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_12_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-013-02 | FUSED_ID : 6359364768394952914
  IC_TEMP :  -51.11 | VDDM : 1132.74 | AUX_INT :   -5.20 | CsaBias :   77.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.51070e-04 / 2
  ADC_P0  : -5.20293e-03 ± 1.72421e-02
  ADC_P1  : 8.35471e-03 ± 4.26249e-04
  ADC_P2  : -5.71223e-06 ± 2.08200e-06
  CSA_Chi2/NDF : 1.31814e-04 / 2
  CSA_P0  : 5.91146e-02 ± 7.65778e-03
  CSA_P1  : 1.02211e-02 ± 5.76958e-04
  CSA_P2  : -4.95079e-05 ± 8.78639e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [3, 67, 68, 100, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [2, 8, 11, 12, 39, 55, 94, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3713', '1.800', '0.1708', '1.800', '0.0938', '7.000', '0.7072', 1, 1, 1, 1, 1725538322.0753157]
VI_after__Init : ['1.202', '0.3714', '1.800', '0.1708', '1.800', '0.0880', '7.000', '0.7072', 1, 1, 1, 1, 1725538330.217734]
VI_at__the_End : ['1.202', '0.5025', '1.800', '0.1394', '1.801', '0.1111', '7.000', '0.7079', 1, 1, 1, 1, 1725538393.9859183]