TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_13_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-014-02 | FUSED_ID : 6359364768394952930
  IC_TEMP :  -49.16 | VDDM : 1128.62 | AUX_INT :   -6.72 | CsaBias :   80.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.43565e-04 / 2
  ADC_P0  : -6.71734e-03 ± 1.96867e-02
  ADC_P1  : 7.94753e-03 ± 4.69886e-04
  ADC_P2  : -4.56101e-06 ± 2.22437e-06
  CSA_Chi2/NDF : 8.72312e-05 / 2
  CSA_P0  : 6.08094e-02 ± 6.22957e-03
  CSA_P1  : 9.73658e-03 ± 4.69353e-04
  CSA_P2  : -4.30376e-05 ± 7.14769e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [14, 27, 33, 45, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [8, 54, 89, 90, 101, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2983', '1.800', '0.1565', '1.800', '0.0856', '7.000', '0.7083', 1, 1, 1, 1, 1725538418.8190448]
VI_after__Init : ['1.201', '0.2983', '1.800', '0.1565', '1.800', '0.0781', '7.000', '0.7076', 1, 1, 1, 1, 1725538426.931418]
VI_at__the_End : ['1.202', '0.4990', '1.800', '0.1412', '1.799', '0.1095', '7.000', '0.7079', 1, 1, 1, 1, 1725538487.2388833]