TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_18_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-017-05 | FUSED_ID : 6359364768394952981
  IC_TEMP :  -53.87 | VDDM : 1142.59 | AUX_INT : -151.30 | CsaBias :  -35.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.58706e-04 / 2
  ADC_P0  : -1.51301e-01 ± 2.62003e-02
  ADC_P1  : 1.06590e-02 ± 6.26164e-04
  ADC_P2  : -1.32566e-05 ± 2.93687e-06
  CSA_Chi2/NDF : 1.35957e-04 / 2
  CSA_P0  : 6.04792e-02 ± 7.77720e-03
  CSA_P1  : 1.01623e-02 ± 5.85956e-04
  CSA_P2  : -4.98086e-05 ± 8.92342e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [55, 60, 76, 89, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [1, 3, 12, 34, 111, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3294', '1.800', '0.1328', '1.800', '0.0924', '7.000', '0.7080', 1, 1, 1, 1, 1725538708.4611154]
VI_after__Init : ['1.202', '0.3293', '1.800', '0.1328', '1.801', '0.0870', '7.000', '0.7079', 1, 1, 1, 1, 1725538717.252507]
VI_at__the_End : ['1.202', '0.5018', '1.800', '0.1401', '1.803', '0.1107', '7.000', '0.7084', 1, 1, 1, 1, 1725538779.6976457]