TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_20_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-018-05 | FUSED_ID : 6359364768394952997
  IC_TEMP :  -58.42 | VDDM : 1127.41 | AUX_INT :   -7.50 | CsaBias :   74.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24271e-03 / 2
  ADC_P0  : -7.49723e-03 ± 2.38780e-02
  ADC_P1  : 8.25040e-03 ± 5.75452e-04
  ADC_P2  : -5.71992e-06 ± 2.75060e-06
  CSA_Chi2/NDF : 1.40146e-04 / 2
  CSA_P0  : 6.07002e-02 ± 7.89611e-03
  CSA_P1  : 1.03205e-02 ± 5.94915e-04
  CSA_P2  : -5.39737e-05 ± 9.05985e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [27, 33, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [22, 23, 35, 42, 98, 106, 108, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2973', '1.800', '0.1286', '1.800', '0.0920', '7.000', '0.7076', 1, 1, 1, 1, 1725538806.2726722]
VI_after__Init : ['1.202', '0.2970', '1.800', '0.1288', '1.800', '0.0865', '7.000', '0.7077', 1, 1, 1, 1, 1725538814.4130392]
VI_at__the_End : ['1.202', '0.4903', '1.800', '0.1379', '1.800', '0.1150', '7.000', '0.7084', 1, 1, 1, 1, 1725538881.2380307]